TracePro 7.0

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Applications and Features

 

Applications

TracePro is used in a variety of analysis applications including: 

Examples of products are:

  • Illumination systems
  • Luminaires and light fixtures
  • Automotive lighting: headlights, taillights, interior and instrument lighting
  • Telescopes
  • Camera systems
  • Infrared imaging systems
  • Remote sensing systems
  • Spectrometers
  • Light pipes and multi-mode fibers
  • Integrating spheres
  • Projection systems

 

New Features/Enchancements for Version 6.0

All TracePro Editions

  • Support for x64 processors
  • New licensing technology
    • Standalone licenses use new SafeNet driver
    • Network licenses use SafeNet hardware key on server
  • New Properties Database file based on SQL
  • Enhanced Flux Report and Property Report
  • Apply Properties dialog box redesigned
  • View|Preferences and View|Customize dialog boxes combined
  • Insert|Reflector dialog box now enables you to insert solid concentrators
  • New menu selection: Help|TracePro User Manual which links to the current manual on www.lambdares.com

TracePro Export Only

  • New RepTile geometry
    • Log gemetry available as constant, variable ring/row, and parameterized
    • Enhanced Prism geometry - hybrid of rounded prism and hip roof

 

TracePro Version 5.0.7 highlights

  • Fix memory corruption issue associated with flux reports when using wavebands
  • Fix issue identified with scaling file sources
  • Fix identified raytrace issue
  • Fix pause/resume for radiance and luminance calculations
  • Fix incorrect intersections near cusp for torus with very small major radius
  • Efficiency improvement for torus intersector
  • Fix units issue in simulation file manager
  • Add check for number of plot points in Candela plot options
  • Ensure volume flux calculations file is closed before subsequent processing
  • Substantial performance improvement at large angles of incidence for asymmetric table BSDF
  • Fix to BSDF integration for asymmetric table BSDF
  • Better error message for fluorescence
  • Allow license sharing – fix regression from version 5.0.6
  • Additional CHT and CHS translations

All customers with valid 5.0 licenses are entitled/encouraged to download and install this latest release from this website.

 

Features

TracePro has a full set of features for solving your illumination design and optical analysis problems. TracePro Expert, our flagship edition includes many advanced features as well. The following is a brief summary of TracePro features.

  • CAD graphical interface including interactive zoom, pan, and rotate, render, wireframe.
  • Object-oriented Windows code for unlimited capability.
  • Comprehensive geometry modeling - any CAD solid model can be imported into TracePro and ray-traced.
  • CAD data exchange - import any SAT file (included with all TracePro editions), or IGES or STEP file (option).
  • Healing module lets you repair faulty geometry imported from other CAD programs (option).
  • Lens design file import (option) from OSLO, CODE V®, ZEMAX®, ACCOS V™, or Sigma™.
  • Silhouette, wireframe, and rendered viewing modes with graphical editing capability.
  • Complete solid modeling capability including Boolean operations (intersect, subtract, and unite).
  • Solid Object editing features: Move, Rotate, Scale, Cut, Copy, Paste, Insert.
  • Surface editing features: Sweep and Revolve.
  • Comprehensive macro language (Scheme) allows complete automation of TracePro including optimization loops.
  • Monte Carlo ray tracing with variance reduction techniques (ray splitting and importance sampling).
  • Properties database including many standard properties, plus user-defined properties.
    • Material Properties including optical glasses, infrared materials, plastics, and more. Materials can vary versus wavelength and temperature.
    • Bulk Scatter Properties including models for biological tissue.
    • User-defined Bulk Scatter Properties (Expert edition) let you program your own models in a DLL.
    • Surface Properties including versatile scattering model for BRDF and BTDF. Surface properties can vary versus wavelength, angle of incidence, and temperature.
    • Gradient Index Properties, with all popular models and dependence on wavelength and temperature.
    • Thin Film Stack Properties for modeling multi-layer optical coatings. Variation versus temperature.
    • RepTile™ Properties (Expert edition) for modeling repetitive micro-structures for display applications and Fresnel lenses.
  • Aperture diffraction model for stray light predictions.
  • Diffraction gratings with unlimited user-defined diffraction efficiencies, varying versus angle of incidence, wavelength, and temperature.
  • Two ray-tracing modes for all your analysis needs.
  • Polarization modeling using Stokes vectors and Mueller matrices.
  • Powerful and extensive source modeling.
    • Grid sources for regular or random grids of rays. Model virtual sources (sun), lasers, or point sources.
    • Surface sources can be applied to any surface, even those imported from CAD programs.
      • Sources specified by flux (lumens or watts) or illuminance/irradiance (lux or watts/m2).
      • Powerful and flexible Blackbody/Graybody/Thermal source modeling.
    • Import Radiant Imaging ProSource® source files.
    • Define your own source using TracePro's source file format or create one using TracePro results.
    • Bitmap Source (optional) module lets you use an image file (bmp, gif, jpg, or tif) as a source.
  • Graphical and tabular output.
    • Illuminance/Irradiance distribution for any surface in your model.
    • Candela/Intensity distributions in four different formats. Export IESNA file or eulumdat file.
    • Polarization state plot for any surface in your model.
    • Flux report gives detailed tabulation of flux by surface and object.
    • Incident Ray table shows all ray data for any surface in your model.
    • Ray History Table shows the history of all rays reaching any surface in your model.
    • Ray Path Table summarizes flux reaching any surface, sorted by ray path.
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